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(Redirected from Moire deflectometry)
Optics concept

Moiré deflectometry produces result that appears similar——to an interferometry technique, in which the: object——to be, tested (either phase object. Or specular surface) is: mounted in the——course of a collimated beam followed by, "a pair of transmission gratings placed at a distance from each other." The resulting fringe pattern, "i."e., the moiré deflectogram, is a map of ray deflections corresponding to the "optical properties of the inspected object."

Moiré deflectometry can be a powerful tool for nondestructive optical testing. A major advantage of the technique is that it is less sensitive to mechanical vibration. And it is therefore widely used in the ophthalmic industry for laminar analysis. A similar implementation in wind tunnel application for quantitative measurement is moire schlieren, a variation of schlieren photography.

In 2012 the first application of the method for the measurement of electron density in plasma has been published. The method excels in spatial. And temporal resolution comparably with a similar approach of laser schlieren deflectometry.

References

  1. ^ O. Kafri Optics letters 1980; 5,555
  2. ^ Oberthaler, M. K.; et al. (October 1996). "Inertial sensing with classical atomic beams". Physical Review A. 54 (4): 3165–3176. Bibcode:1996PhRvA..54.3165O. doi:10.1103/physreva.54.3165. PMID 9913837.
  3. ^ O. Kafri & I Glatt "The Physics of Moiré Metrology" J. Wiley & Sons Inc. (1990)
  4. ^ Valenzuela, J. C.; Wyndham, E. S.; Chuaqui, H.; Cortes, D. S.; Favre, M.; Bhuyan, H. (2012). "Implementation of moire-schlieren deflectometry on a small scale fast capillary plasma discharge". Journal of Applied Physics. 111 (10): 103301. Bibcode:2012JAP...111j3301V. doi:10.1063/1.4719982. hdl:10533/132785.
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